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Development of a sequence-characterized amplified region marker for detection of Ascochyta rabiei causing Ascochyta blight in chickpea
MS. Baite, BK. Upadhyay, SC. Dubey,
Language English Country United States
Document type Journal Article
- MeSH
- Ascomycota genetics pathogenicity MeSH
- Cicer microbiology MeSH
- DNA, Fungal genetics MeSH
- Genetic Markers * MeSH
- Plant Diseases microbiology MeSH
- Base Sequence MeSH
- Sensitivity and Specificity MeSH
- Nucleic Acid Amplification Techniques MeSH
- Publication type
- Journal Article MeSH
Ascochyta blight of chickpea is caused by Ascochyta rabiei (Pass.) Labr. which is primarily seedborne. For rapid detection and precise identification of A. rabiei, a sequence-characterized amplified region (SCAR) marker was developed for detection of genomic DNA and infected plant DNA. An SSR primer amplified monomorphic band was cloned in pGEM®-T easy vector and sequenced. The best primer pair was selected and validated on A. rabiei. The specificity and sensitivity of the SCAR-based marker designated as MBAR was evaluated using conventional PCR and real-time PCR. The marker produced consistently an amplicon size of 196 bp in all A. rabiei isolates tested. The sensitivity of the marker was 0.1 ng of genomic fungal DNA and 0.5 ng of plant DNA by conventional PCR and 0.5 pg of A. rabiei DNA and 1.0 pg of plant DNA by real-time PCR. This is the first SCAR marker having high specificity and sensitivity towards A. rabiei. The marker may be useful in detecting the pathogen before the disease appearance and in plant quarantine program to detect the pathogen in seed lots.
Crop Protection Division ICAR National Rice Research Institute Cuttack Odisha 753006 India
Division of Plant Pathology ICAR Indian Agricultural Research Institute New Delhi 110012 India
Division of Plant Quarantine ICAR National Bureau of Plant Genetic Resources New Delhi 110 012 India
References provided by Crossref.org
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