The twin distribution in topological insulators Bi2Te3 and Bi2Se3 was imaged by electron backscatter diffraction (EBSD) and scanning X-ray diffraction microscopy (SXRM). The crystal orientation at the surface, determined by EBSD, is correlated with the surface topography, which shows triangular pyramidal features with edges oriented in two different orientations rotated in the surface plane by 60°. The bulk crystal orientation is mapped out using SXRM by measuring the diffracted X-ray intensity of an asymmetric Bragg peak using a nano-focused X-ray beam scanned over the sample. By comparing bulk- and surface-sensitive measurements of the same area, buried twin domains not visible on the surface are identified. The lateral twin domain size is found to increase with the film thickness.

Faculty of Mathematics and Physics Charles University Ke Karlovu 5 121 16 Prague 2 Czech Republic

Institut für Experimentelle Physik Otto von Guericke Universität Magdeburg Universitätsplatz 2 39106 Magdeburg Germany

Institute of Semiconductor and Solid State Physics Johannes Kepler University Linz Altenbergerstrasse 69 4040 Linz Austria

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Twin Domain Structure in Magnetically Doped Bi2Se3 Topological Insulator