Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold

. 2018 Jan 01 ; 25 (Pt 1) : 77-84. [epub] 20180101

Status PubMed-not-MEDLINE Jazyk angličtina Země Spojené státy americké Médium print-electronic

Typ dokumentu časopisecké články

Perzistentní odkaz   https://www.medvik.cz/link/pmid29271755

Grantová podpora
14 HTSM 05 The Dutch Topconsortia Kennis en Innovatie (TKI) program on high-tech systems and materials
DEC-2011/03/B/ST3/02453 Polish National Science Center
DEC-2012/06/M/ST3/00475 Polish National Science Center
REGPOT-CT-2013-316014 EU FP7 EAGLE project co-financed by the Polish Ministry of Science and Higher Education
14-29772S Czech Science Foundation
17-05167S Czech Science Foundation
LG15013 the Ministry of Education, Youth and Sports of the Czech Republic
CZ.02.1.01/0.0/0.0/16_013/0001552 the Ministry of Education, Youth and Sports of the Czech Republic
APVV-15-0202 Scientific Grant Agency of the Ministry of Education, Science, Research and Sport of the Slovak Republic and the Slovak Academy of Sciences
APVV-14-0085 Scientific Grant Agency of the Ministry of Education, Science, Research and Sport of the Slovak Republic and the Slovak Academy of Sciences

The durability of grazing- and normal-incidence optical coatings has been experimentally assessed under free-electron laser irradiation at various numbers of pulses up to 16 million shots and various fluence levels below 10% of the single-shot damage threshold. The experiment was performed at FLASH, the Free-electron LASer in Hamburg, using 13.5 nm extreme UV (EUV) radiation with 100 fs pulse duration. Polycrystalline ruthenium and amorphous carbon 50 nm thin films on silicon substrates were tested at total external reflection angles of 20° and 10° grazing incidence, respectively. Mo/Si periodical multilayer structures were tested in the Bragg reflection condition at 16° off-normal angle of incidence. The exposed areas were analysed post-mortem using differential contrast visible light microscopy, EUV reflectivity mapping and scanning X-ray photoelectron spectroscopy. The analysis revealed that Ru and Mo/Si coatings exposed to the highest dose and fluence level show a few per cent drop in their EUV reflectivity, which is explained by EUV-induced oxidation of the surface.

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