We apply atomic force microscope for local electrostatic charging of oxygen-terminated nanocrystalline diamond (NCD) thin films deposited on silicon, to induce electrostatically driven self-assembly of colloidal alumina nanoparticles into micro-patterns. Considering possible capacitive, sp2 phase and spatial uniformity factors to charging, we employ films with sub-100 nm thickness and about 60% relative sp2 phase content, probe the spatial material uniformity by Raman and electron microscopy, and repeat experiments at various positions. We demonstrate that electrostatic potential contrast on the NCD films varies between 0.1 and 1.2 V and that the contrast of more than ±1 V (as detected by Kelvin force microscopy) is able to induce self-assembly of the nanoparticles via coulombic and polarization forces. This opens prospects for applications of diamond and its unique set of properties in self-assembly of nano-devices and nano-systems.

Institute of Physics ASCR Cukrovarnicka 10 16253 Prague 6 Czech Republic

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Fudouzi H, Kobayashi M, Shinya N. "Site-controlled deposition of microsized particles using an electrostatic assembly". Adv Mater. 2002;14:1649. doi: 10.1002/1521-4095(20021118)14:22<1649::AID-ADMA1649>3.0.CO;2-Z. DOI

Wright W, Chetwynd D. "Can charge writing aid nanotechnological manipulation?". Nanotechnology. 1998;9:133. doi: 10.1088/0957-4484/9/2/016. DOI

Mesquida P, Stemmer A. "Attaching silica nanoparticles from suspension onto surface charge patterns generated by a conductive atomic force microscope tip". Adv Mater. 2001;13:1395. doi: 10.1002/1521-4095(200109)13:18<1395::AID-ADMA1395>3.0.CO;2-0. DOI

Jacobs H, Stemmer A. "Measuring and modifying the electric surface potential distribution on a nanometre scale: a powerful tool in science and technology". Surf Interface Anal. 1999;27:361. doi: 10.1002/(SICI)1096-9918(199905/06)27:5/6<361::AID-SIA482>3.0.CO;2-8. DOI

Rezek B, Mates T, Stuchlík J, Kočka J, Stemmer A. "Charge storage in undoped hydrogenated amorphous silicon by ambient atomic force microscopy". Appl Phys Lett. 2003;83:1764. doi: 10.1063/1.1606872. DOI

Naujoks N, Stemmer A. "Micro- and nanoxerography in liquids - controlling pattern definition". Microelectron Eng. 2005;78/79:331. doi: 10.1016/j.mee.2004.12.043. DOI

Rezek B, Shin D, Watanabe H, Nebel CE. "Intrinsic hydrogen-terminated diamond as ion-sensitive field effect transistor". Sens Actuators B. 2007;122:596. doi: 10.1016/j.snb.2006.07.004. DOI

Rezek B, Shin D, Uetsuka H, Nebel CE. "Microscopic diagnostics of DNA molecules on mono-crystalline diamond". Phys Status Solidi A. 2007;204:2888. doi: 10.1002/pssa.200776317. DOI

Kalbacova M, Kalbac M, Dunsch L, Kromka A, Vaněček M, Rezek B, Hempel U, Kmoch S. "The effect of SWCNT and nano-diamond films on human osteoblast cells". Phys Status Solidi B. 2007;244:4356. doi: 10.1002/pssb.200776166. DOI

Kromka A, Rezek B, Remeš Z, Michalka M, Ledinský M, Zemek J, Potměšil J, Vaněček M. "Formation of continuous nanocrystalline diamond layers on glass and silicon at low temperatures". Chem Vap Deposition. 2008;14:181. doi: 10.1002/cvde.200706662. DOI

Nebel CE. "Semiconductor materials: From gemstone to semiconductor". Nat Mater. 2003;2:431. doi: 10.1038/nmat935. PubMed DOI

Koizumi S, Kamo M, Sato Y, Ozaki H, Inuzuka T. "Growth and characterization of phosphorous doped {111} homoepitaxial diamond thin films". Appl Phys Lett. 1997;71:1065. doi: 10.1063/1.119729. DOI

Chakrapani V, Angus JC, Anderson AB, Wolter SD, Stoner BR, Sumanasekera GU. "Charge transfer equilibria between diamond and an aqueous oxygen electrochemical redox couple". Science. 2007;318:1424. doi: 10.1126/science.1148841. PubMed DOI

Nebel CE, Rezek B, Shin D, Watanabe H, Yamamoto T. "Electronic properties of H-terminated diamond in electrolyte solutions". J Appl Phys. 2006;99:033711. doi: 10.1063/1.2171805. DOI

Bergonzo P, Tromson D, Mer C. "Radiation detection devices made from CVD diamond". Semicond Sci Technol. 2003;18:S105. doi: 10.1088/0268-1242/18/3/315. DOI

Koide Y, Liao M, Alvarez J. "Thermally stable solar-blind diamond UV photodetector". Diamond Relat Mater. 2006;15:1962. doi: 10.1016/j.diamond.2006.08.009. DOI

Stallhofer M, Seifert M, Hauf MV, Abstreiter G, Stutzmann M, Garrido JA, Holleitner AW. "Photoconductance of a submicron oxidized line in surface conductive single crystalline diamond". Appl Phys Lett. 2010;97:111107. doi: 10.1063/1.3487785. DOI

Sumikawa Y, Banno T, Kobayashi K, Itoh Y, Umezawa H, Kawarada H. "Memory effect of diamond in-plane-gated field-effect transistors". Appl Phys Lett. 2004;85:139. doi: 10.1063/1.1767272. DOI

Čermák J, Kromka A, Rezek B. "Electrical characterization of locally charged oxidized nanocrystalline diamond films by Kelvin force microscopy". Phys Status Solidi A. 2008;205:2136.

Verveniotis E, Čermák J, Kromka A, Rezek B. "AFM induced electrostatic charging of nanocrystalline diamond on silicon". Phys Status Solidi B. 2009;246:2798. doi: 10.1002/pssb.200982305. DOI

Verveniotis E, Čermák J, Kromka A, Ledinský M, Remeš Z, Rezek B. "Local electrostatic charging differences of sub-100 nm nanocrystalline diamond films". Phys Status Solidi A. 2010;207:2040. doi: 10.1002/pssa.201000014. DOI

Rezek B, Michalíková L, Ukraintsev E, Kromka A, Kalbacova M. Micro-pattern guided adhesion of osteoblasts on diamond surfaces". Sensors. 2009;9:3549. doi: 10.3390/s90503549. PubMed DOI PMC

Rezek B, Nebel CE. "Kelvin force microscopy on diamond surfaces and devices". Diamond Relat Mater. 2005;14:466. doi: 10.1016/j.diamond.2005.01.041. DOI

Kozak H, Kromka A, Ledinsky M, Rezek B. "Enhancing nanocrystalline diamond surface conductivity by deposition temperature and chemical post-processing". Phys Status Solidi A. 2009;206:276. doi: 10.1002/pssa.200824355. DOI

Bartošík M, Škoda D, Tomanec O, Kalousek R, Jánský P, Zlámal J, Spousta J, Dub P, Šikola T. "Role of humidity in local anodic oxidation: A study of water condensation and electric field distribution". Phys Rev B. 2009;79:195406.

Singh R, Arora SK, Tyagi R, Agarwal SK, Kanjila D. "Temperature dependence of current-voltage characteristics of Au/n-GaAs epitaxial Schottky diode". Bull Mater Sci. 2000;23:471. doi: 10.1007/BF02903886. DOI

Rezek B, Stuchlík J, Fejfar A, Kočka J. "Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection". J Appl Phys. 2002;92:587. doi: 10.1063/1.1486032. DOI

Häfliger D, Plitzko J, Hillenbrand R. "Contrast and scattering efficiency of scattering-type near-field optical probes". Appl Phys Lett. 2004;85:4466.

Verveniotis E, Rezek B, Šípek E, Stuchlik J, Kočka J. "Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon". Thin Solid Films. 2010;518:5965. doi: 10.1016/j.tsf.2010.05.107. DOI