Nanometrology
Status PubMed-not-MEDLINE Jazyk angličtina Země Švýcarsko Médium electronic
Typ dokumentu úvodníky
PubMed
36364536
PubMed Central
PMC9657443
DOI
10.3390/nano12213755
PII: nano12213755
Knihovny.cz E-zdroje
Apart from being the subject of this Special Issue, what is nanometrology [...].
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Hansen P.-E., Roebben G., editors. Introductory Guide to Nanometrology. European Commission; Brussels, Switzerland: 2010. Coordination of Nanometrology in Europe Project (FP7 CSA-CA 218764)
Yacoot A., Bosse H., Dixson R. The lattice parameter of silicon; a secondary realisation of the metre. Meas. Sci. Technol. 2020;31:2020. doi: 10.1088/1361-6501/abb2ba. DOI
Tzalenchuk A., Spethmann N., Prior T., Hendricks J., Pan Y., Bubanja V., Temporão G., Yu D.-H., Ilić D., Goldstein B. The expanding role of National Metrology Institutes in the quantum era. Nat. Phys. 2022;18:724–727. doi: 10.1038/s41567-022-01659-z. DOI
Beckhoff B. Traceable Characterization of Nanomaterials by X-ray Spectrometry Using Calibrated Instrumentation. Nanomaterials. 2022;12:2255. doi: 10.3390/nano12132255. PubMed DOI PMC
Piquemal F., Morán-Meza J., Delvallée A., Richert D., Kaja K. Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy. Nanomaterials. 2021;11:820. doi: 10.3390/nano11030820. PubMed DOI PMC
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Andrle A., Hönicke P., Gwalt G., Schneider P.-I., Kayser Y., Siewert F., Soltwisch V. Shape- and Element-Sensitive Reconstruction of Periodic Nanostructures with Grazing Incidence X-ray Fluorescence Analysis and Machine Learning. Nanomaterials. 2021;11:1647. doi: 10.3390/nano11071647. PubMed DOI PMC
Nečas D., Klapetek P. Synthetic Data in Quantitative Scanning Probe Microscopy. Nanomaterials. 2021;11:1746. doi: 10.3390/nano11071746. PubMed DOI PMC
Nee T.-E., Wang J.-C., Zhong B.-Y., Hsiao J.-J., Wu Y.-F. Thermophysical Characterization of Efficiency Droop in GaN-Based Light-Emitting Diodes. Nanomaterials. 2021;11:1449. doi: 10.3390/nano11061449. PubMed DOI PMC
