mikroskopie atomárních sil [Microscopy, Atomic Force]
- Termíny
-
Atomic Force Microscopy
Force Microscopy
Scanning Force Microscopy
A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.
- DUI
- D018625 MeSH Prohlížeč
- CUI
- M0027912
- Předchozí užití
- Microscopy (1988-1994); Microscopy, Scanning Tunneling (1988-1994)
- Historická pozn.
- 95
- Veřejná pozn.
- 95
Povolená podhesla
- HI
- dějiny 1
- EC
- ekonomika 0
- ES
- etika 0
- CL
- klasifikace 0
- MT
- metody 33
- ST
- normy 0
- IS
- přístrojové vybavení 11
- SN
- statistika a číselné údaje 0
- TD
- trendy 0
- VE
- veterinární 0