Microscopy, Atomic Force [mikroskopie atomárních sil]

topical
117
Terms

Atomic Force Microscopy
Force Microscopy
Scanning Force Microscopy

Persistent link   https://www.medvik.cz/link/D018625
Definition

A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.

DUI
D018625 MeSH Browser
CUI
M0027912
Previous indexing
Microscopy (1988-1994); Microscopy, Scanning Tunneling (1988-1994)
History note
95
Public note
95

Allowable subheadings

CL
classification
EC
economics
ES
ethics
HI
history 1
IS
instrumentation 11
MT
methods 33
ST
standards
SN
statistics & numerical data
TD
trends
VE
veterinary

E Analytical, Diagnostic and Therapeutic Techniques and Equipment
E01 Diagnosis 1 793
E01.370 Diagnostic Techniques and Procedures 3 426
E01.370.350 Diagnostic Imaging 3 260
E01.370.350.515 Microscopy 1 104
E01.370.350.515.666 Microscopy, Scanning Probe 4
E01.370.350.515.666.400 Microscopy, Atomic Force 117
E01.370.350.515.666.450 Microscopy, Electrochemical, Scanning 6
E01.370.350.515.666.500 Microscopy, Scanning Tunneling 4
E05 Investigative Techniques 209
E05.595 Microscopy 1 104
E05.595.666 Microscopy, Scanning Probe 4
E05.595.666.400 Microscopy, Atomic Force 117
E05.595.666.450 Microscopy, Electrochemical, Scanning 6
E05.595.666.500 Microscopy, Scanning Tunneling 4

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