Scanning microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING).

DUI

D020527 MeSH Browser

CUI

M0027913

Previous indexing

Microscopy, Atomic Force (1999)

History note

2000; use MICROSCOPY, ATOMIC FORCE 1999

Public note

2000; see MICROSCOPY, ATOMIC FORCE 1999