Scanning microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING).

DUI

D020527 MeSH Prohlížeč

CUI

M0027913

Předchozí užití

Microscopy, Atomic Force (1999)

Historická pozn.

2000; use MICROSCOPY, ATOMIC FORCE 1999

Veřejná pozn.

2000; see MICROSCOPY, ATOMIC FORCE 1999