Spectrometry, Mass, Secondary Ion [spektrometrie hmotnostní sekundárních iontů]
- Terms
-
Mass Spectrometry, Secondary Ion
Mass Spectroscopy, Secondary Ion
Secondary Ion Mass Spectrometry
Secondary Ion Mass Spectrometry Microscopy
Secondary Ion Mass Spectroscopy
Secondary Ion Mass Spectroscopy Microscopy
SIMS Microscopy
Spectroscopy, Mass, Secondary Ion
A mass-spectrometric technique that is used for microscopic chemical analysis. A beam of primary ions with an energy of 5-20 kiloelectronvolts (keV) bombards a small spot on the surface of the sample under ultra-high vacuum conditions. Positive and negative secondary ions sputtered from the surface are analyzed in a mass spectrometer in regards to their mass-to-charge ratio. Digital imaging can be generated from the secondary ion beams and their intensity can be measured. Ionic images can be correlated with images from light or other microscopy providing useful tools in the study of molecular and drug actions.
- Annotation
- for SIMS microscopy, coordinate with type of microscopy
- DUI
- D018629 MeSH Browser
- CUI
- M0027922
- Previous indexing
- Spectrum Analysis, Mass (1976-1994)
- History note
- 95
- Public note
- 95
Allowable subheadings
- CL
- classification
- EC
- economics
- ES
- ethics
- HI
- history
- IS
- instrumentation 6
- MT
- methods 11
- ST
- standards
- SN
- statistics & numerical data 1
- TD
- trends
- VE
- veterinary