Two-dimensional layered materials offer the possibility to create artificial vertically stacked structures possessing an additional degree of freedom-the interlayer twist. We present a comprehensive optical study of artificially stacked bilayers (BLs) MoS[Formula: see text] encapsulated in hexagonal BN with interlayer twist angle ranging from 0[Formula: see text] to 60[Formula: see text] using Raman scattering and photoluminescence spectroscopies. It is found that the strength of the interlayer coupling in the studied BLs can be estimated using the energy dependence of indirect emission versus the A[Formula: see text]-E[Formula: see text] energy separation. Due to the hybridization of electronic states in the valence band, the emission line related to the interlayer exciton is apparent in both the natural (2H) and artificial (62[Formula: see text]) MoS[Formula: see text] BLs, while it is absent in the structures with other twist angles. The interlayer coupling energy is estimated to be of about 50 meV. The effect of temperature on energies and intensities of the direct and indirect emission lines in MoS[Formula: see text] BLs is also quantified.

Department of Condensed Matter Physics Faculty of Mathematics and Physics Charles University Ke Karlovu 5 121 16 Prague 2 Czech Republic

Institute of Experimental Physics Faculty of Physics University of Warsaw ul Pasteura 5 02 093 Warsaw Poland

International Center for Materials Nanoarchitectonics National Institute for Materials Science 1 1 Namiki Tsukuba 305 0044 Japan

Laboratoire National des Champs Magnétiques Intenses CNRS UGA UPS INSA EMFL 25 Avenue des Martyrs 38042 Grenoble France

Research Center for Functional Materials National Institute for Materials Science 1 1 Namiki Tsukuba 305 0044 Japan

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