Interferometric scattering microscopy is a powerful technique that enables various applications, such as mass photometry and particle tracking. Here, we present a numerical toolbox to simulate images obtained in interferometric scattering, coherent bright-field, and dark-field microscopies. The scattered fields are calculated using a boundary element method, facilitating the simulation of arbitrary sample geometries and substrate layer structures. A fully vectorial model is used for simulating the imaging setup. We demonstrate excellent agreement between our simulations and experiments for different shapes of scatterers and excitation angles. Notably, for angles near the Brewster angle, we observe a contrast enhancement which may be beneficial for nanosensing applications. The software is available as a matlab toolbox.

Department of Optics Faculty of Science Palacký University 17 Listopadu 12 77900 Olomouc Czech Republic

Institute of Physics University of Graz Universitätsplatz 5 8010 Graz Austria

University of Vienna Faculty of Physics VCQ 1090 Vienna Austria

University of Vienna Max Perutz Laboratories Department of Structural and Computational Biology 1030 Vienna Austria

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