Vanadium dioxide (VO2) has received significant interest in the context of nanophotonic metamaterials and memories owing to its reversible insulator-metal transition associated with significant changes in its optical and electronic properties. The phase transition of VO2 has been extensively studied for several decades, and the ways how to control its hysteresis characteristics relevant for memory applications have significantly improved. However, the hysteresis dynamics and stability of coexisting phases during the transition have not been studied on the level of individual single-crystal VO2 nanoparticles (NPs), although they represent the fundamental component of ordinary polycrystalline films and can also act like nanoscale memory units on their own. Here, employing transmission electron microscopy techniques, we investigate phase transitions of single VO2 NPs in real time. Our analysis reveals the statistical distribution of the transition temperature and steepness and how they differ during forward (heating) and backward (cooling) transitions. We evaluate the stability of coexisting phases in individual NPs and prove the persistent multilevel memory at near room temperatures using only a few VO2 NPs. Our findings unveil the physical mechanisms that govern the hysteresis of VO2 at the nanoscale and establish VO2 NPs as a promising component of optoelectronic and memory devices with enhanced functionalities.

• Klíčová slova
• coexisting phases, hysteresis, insulator−metal transition, nanophotonics, phase-change memory, transmission electron microscopy, vanadium dioxide,
• Publikační typ
• časopisecké články MeSH

Vanadium dioxide (VO2) is a strongly correlated material that exhibits the insulator-to-metal transition (IMT) near room temperature, which makes it a promising candidate for applications in nanophotonics or optoelectronics. However, creating VO2 nanostructures with the desired functionality can be challenging due to microscopic inhomogeneities that can significantly impact the local optical and electronic properties. Thin lamellas, produced by focused ion beam milling from a homogeneous layer, provide a useful prototype for studying VO2 at the truly microscopic level using a scanning transmission electron microscope (STEM). High-resolution imaging is used to identify structural inhomogeneities while electron energy-loss spectroscopy (EELS) supported by statistical analysis helps to detect V x O y stoichiometries with a reduced oxidation number of vanadium at the areas of thickness below 70 nm. On the other hand, the thicker areas are dominated by vanadium dioxide, where the signatures of the IMT are detected in both core-loss and low-loss EELS experiments with in situ heating. The experimental results are interpreted with ab initio and semi-classical calculations. This work shows that structural inhomogeneities such as pores and cracks present no harm to the desired optical properties of VO2 samples.

• Publikační typ
• časopisecké články MeSH