Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids
Status PubMed-not-MEDLINE Jazyk angličtina Země Spojené státy americké Médium print
Typ dokumentu časopisecké články
PubMed
19546907
DOI
10.1364/oe.15.006036
PII: 134447
Knihovny.cz E-zdroje
- Publikační typ
- časopisecké články MeSH
A linear accelerator based source of coherent radiation, FLASH (Free-electron LASer in Hamburg) provides ultra-intense femtosecond radiation pulses at wavelengths from the extreme ultraviolet (XUV; lambda<100nm) to the soft X-ray (SXR; lambda<30nm) spectral regions. 25-fs pulses of 32-nm FLASH radiation were used to determine the ablation parameters of PMMA - poly (methyl methacrylate). Under these irradiation conditions the attenuation length and ablation threshold were found to be (56.9+/-7.5) nm and approximately 2 mJ*cm(-2), respectively. For a second wavelength of 21.7 nm, the PMMA ablation was utilized to image the transverse intensity distribution within the focused beam at mum resolution by a method developed here.
Citace poskytuje Crossref.org
Damage Mechanisms in Polyalkenes Irradiated with Ultrashort XUV/X-Ray Laser Pulses