Chemical identification of single atoms in heterogeneous III-IV chains on Si(100) surface by means of nc-AFM and DFT calculations
Jazyk angličtina Země Spojené státy americké Médium print-electronic
Typ dokumentu časopisecké články, práce podpořená grantem
PubMed
22747258
DOI
10.1021/nn301996k
Knihovny.cz E-zdroje
- MeSH
- chemické modely * MeSH
- cín chemie MeSH
- indium chemie MeSH
- křemík chemie MeSH
- mikroskopie atomárních sil metody MeSH
- počítačová simulace MeSH
- testování materiálů metody MeSH
- Publikační typ
- časopisecké články MeSH
- práce podpořená grantem MeSH
- Názvy látek
- cín MeSH
- indium MeSH
- křemík MeSH
Chemical identification of individual atoms in mixed In-Sn chains grown on a Si(100)-(2 × 1) surface was investigated by means of room temperature dynamic noncontact AFM measurements and DFT calculations. We demonstrate that the chemical nature of each atom in the chain can be identified by means of measurements of the short-range forces acting between an AFM tip and the atom. On the basis of this method, we revealed incorporation of silicon atoms from the substrate into the metal chains. Analysis of the measured and calculated short-range forces indicates that even different chemical states of a single atom can be distinguished.
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