Volume Electron Microscopy [objemová elektronová mikroskopie]
- Terms
-
FIB-SEM
SBF-SEM
ssTEM
-
FIB-SEM
Focused Ion Beam Scanning Electron Microscopy
Focused Ion Beam SEM
SBF-SEM
Serial Block-Face Scanning Electron Microscopy
Serial Block-Face SEM
Serial Sectioning TEM
Serial Sectioning Transmission Electron Microscopy
ssTEM
vEM Volume Electron Microscopy
Volume EM
Electron microscopy techniques designed to reconstruct 3-D images at micrometer volume scales at nanometer (nm) level resolutions. Volume electron microscopy uses various techniques to render, segment and reconstruct 3-D images from stacked sequential 2-D images of incremental z-planes.
- DUI
- D000094443 MeSH Browser
- CUI
- M000755966
- Previous indexing
- Microscopy, Electron (1983-2022)
- History note
- 2023
- Public note
- 2023
Allowable subheadings
- CL
- classification 0
- EC
- economics 0
- ES
- ethics 0
- HI
- history 0
- IS
- instrumentation 0
- MT
- methods 0
- ST
- standards 0
- SN
- statistics & numerical data 0
- TD
- trends 0
- VE
- veterinary 0