Microscopy, Electron, Scanning [mikroskopie elektronová rastrovací]
- Terms
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mikroskopie elektronová skeningová
skenovací elektronová mikroskopie
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Electron Scanning Microscopy
Scanning Electron Microscopy
Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY.
- Annotation
- do not confuse with MICROSCOPY, ELECTRON, SCANNING TRANSMISSION or STEM
- DUI
- D008855 MeSH Browser
- CUI
- M0013811
- Previous indexing
- Microscopy, Electron (1966-1968)
- History note
- 72(69)
- Public note
- 72
Allowable subheadings
- CL
- classification
- EC
- economics
- ES
- ethics
- HI
- history 1
- IS
- instrumentation 17
- MT
- methods 109
- ST
- standards 1
- SN
- statistics & numerical data 3
- TD
- trends 1
- VE
- veterinary 48