Implementation of a crossed-slit system for fast alignment of sealed polycapillary X-ray optics
Status PubMed-not-MEDLINE Jazyk angličtina Země Spojené státy americké Médium print-electronic
Typ dokumentu časopisecké články
Grantová podpora
CZ.02.1.01/0.0/0.0/16_019/0000789
European Regional Development Fund
CZ.02.1.01/0.0/0.0/15_003/0000447
European Regional Development Fund
2017/27/B/ST2/01890
National Science Centre (Poland)
PubMed
33147201
PubMed Central
PMC7642965
DOI
10.1107/s1600577520012217
PII: S1600577520012217
Knihovny.cz E-zdroje
- Klíčová slova
- X-ray focusing optics, X-ray slits, X-ray sources, alignment, polycapillaries,
- Publikační typ
- časopisecké články MeSH
A new modification of a table-top laser-driven water-jet plasma X-ray source has been successfully implemented and commissioned at the Extreme Light Infrastructure (ELI) Beamlines user facility. In order to preserve the broadband nature of the source for spectroscopic experiments, a polycapillary lens was initially chosen as the focusing element. Generally, polycapillary X-ray optics have a narrow photon acceptance angle and small field of view, making alignment complicated and time-consuming. This contribution demonstrates a straightforward, reliable and reproducible procedure for aligning polycapillary focusing optics with broadband X-rays. The method involves a pre-alignment step where two X-ray slits are mounted orthogonally on opposite sides of a 3D-printed cylindrical polycapillary holder. This helps to precisely determine the optical axis of the X-ray beam. Subsequent mounting of the polycapillary in the pre-aligned holder with the slits removed allowed for immediate transmission of the X-ray photons through the optics and has provided a good starting point for fine alignment.
Division of Chemical Physics Lund University Box 117 Lund 22100 Sweden
Institute of Nuclear Physics Polish Academy of Sciences Radzikowskiego 152 Krakow 31342 Poland
RP4 ELI Beamlines Za Radnici 835 Dolni Brezany 25241 Czech Republic
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X-ray spectroscopy station for sample characterization at ELI Beamlines