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Accurate structure refinement from electron-diffraction data is not possible without taking the dynamical-diffraction effects into account. A complete three-dimensional model of the structure can be obtained only from a sufficiently complete three-dimensional data set. In this work a method is presented for crystal structure refinement from the data obtained by electron diffraction tomography, possibly combined with precession electron diffraction. The principle of the method is identical to that used in X-ray crystallography: data are collected in a series of small tilt steps around a rotation axis, then intensities are integrated and the structure is optimized by least-squares refinement against the integrated intensities. In the dynamical theory of diffraction, the reflection intensities exhibit a complicated relationship to the orientation and thickness of the crystal as well as to structure factors of other reflections. This complication requires the introduction of several special parameters in the procedure. The method was implemented in the freely available crystallographic computing system Jana2006.
- Klíčová slova
- dynamical diffraction, electron crystallography, electron diffraction tomography,
- Publikační typ
- časopisecké články MeSH
The recently published method for the structure refinement from three-dimensional precession electron diffraction data using dynamical diffraction theory [Palatinus et al. (2015). Acta Cryst. A71, 235-244] has been applied to a set of experimental data sets from five different samples - Ni2Si, PrVO3, kaolinite, orthopyroxene and mayenite. The data were measured on different instruments and with variable precession angles. For each sample a reliable reference structure was available. A large series of tests revealed that the method provides structure models with an average error in atomic positions typically between 0.01 and 0.02 Å. The obtained structure models are significantly more accurate than models obtained by refinement using kinematical approximation for the calculation of model intensities. The method also allows a reliable determination of site occupancies and determination of absolute structure. Based on the extensive tests, an optimal set of the parameters for the method is proposed.
- Klíčová slova
- dynamical diffraction, electron crystallography, electron diffraction tomography, kaolinite, mayenite, orthopyroxene, precession,
- Publikační typ
- časopisecké články MeSH
Electron diffraction is a unique tool for analysing the crystal structures of very small crystals. In particular, precession electron diffraction has been shown to be a useful method for ab initio structure solution. In this work it is demonstrated that precession electron diffraction data can also be successfully used for structure refinement, if the dynamical theory of diffraction is used for the calculation of diffracted intensities. The method is demonstrated on data from three materials - silicon, orthopyroxene (Mg,Fe)(2)Si(2)O(6) and gallium-indium tin oxide (Ga,In)(4)Sn(2)O(10). In particular, it is shown that atomic occupancies of mixed crystallographic sites can be refined to an accuracy approaching X-ray or neutron diffraction methods. In comparison with conventional electron diffraction data, the refinement against precession diffraction data yields significantly lower figures of merit, higher accuracy of refined parameters, much broader radii of convergence, especially for the thickness and orientation of the sample, and significantly reduced correlations between the structure parameters. The full dynamical refinement is compared with refinement using kinematical and two-beam approximations, and is shown to be superior to the latter two.
- Klíčová slova
- dynamical diffraction, orthopyroxene, precession electron diffraction, site occupancy,
- Publikační typ
- časopisecké články MeSH
A considerable number of fatal intoxications have recently been connected with the growing popularity of new psychoactive substances (NPS). Therefore, there is a significant demand for the development of fast and facile field detection methods for NPS. These substances are often sold as blends (with inorganic or organic cutting agents), which may further complicate detection. X-Ray powder diffraction (XRPD) was evaluated as a suitable and easily employable analytical method for the identification of NPS. XRPD has been successfully used for the differentiation of eight synthetic cathinones with a similar molecular structure. Moreover, this method was also used for the identification of four drugs in authentic street samples. XRPD is a facile non-destructive method that can identify not only NPS in mixtures but also the cutting agents. The small amount of substances needed for the measurement, which can be re-used for other analyses, further enhances the versatility of this method.
- Klíčová slova
- Cathinones, Drug analysis, Drug identification, New psychoactive substances, X-Ray powder diffraction,
- MeSH
- alkaloidy analýza MeSH
- difrakce rentgenového záření MeSH
- prášková difrakce MeSH
- psychotropní léky analýza MeSH
- stimulanty centrálního nervového systému analýza MeSH
- Publikační typ
- časopisecké články MeSH
- Názvy látek
- alkaloidy MeSH
- cathinone MeSH Prohlížeč
- psychotropní léky MeSH
- stimulanty centrálního nervového systému MeSH
Determination of the absolute configuration of organic molecules is essential in drug development and the subsequent approval process. We show that this determination is possible through electron diffraction using nanocrystalline material. Ab initio structure determination by electron diffraction has so far been limited to compounds that maintain their crystallinity after a dose of one electron per square angstrom or more. We present a complete structure analysis of a pharmaceutical cocrystal of sofosbuvir and l-proline, which is about one order of magnitude less stable. Data collection on multiple positions of a crystal and an advanced-intensity extraction procedure enabled us to solve the structure ab initio. We further show that dynamical diffraction effects are strong enough to permit unambiguous determination of the absolute structure of material composed of light scatterers.
- MeSH
- antivirové látky chemie MeSH
- difrakce rentgenového záření metody MeSH
- elektrony MeSH
- nanočástice chemie ultrastruktura MeSH
- prolin chemie MeSH
- racionální návrh léčiv * MeSH
- sofosbuvir chemie MeSH
- Publikační typ
- časopisecké články MeSH
- práce podpořená grantem MeSH
- Názvy látek
- antivirové látky MeSH
- prolin MeSH
- sofosbuvir MeSH
Single-particle diffraction from X-ray Free Electron Lasers offers the potential for molecular structure determination without the need for crystallization. In an effort to further develop the technique, we present a dataset of coherent soft X-ray diffraction images of Coliphage PR772 virus, collected at the Atomic Molecular Optics (AMO) beamline with pnCCD detectors in the LAMP instrument at the Linac Coherent Light Source. The diameter of PR772 ranges from 65-70 nm, which is considerably smaller than the previously reported ~600 nm diameter Mimivirus. This reflects continued progress in XFEL-based single-particle imaging towards the single molecular imaging regime. The data set contains significantly more single particle hits than collected in previous experiments, enabling the development of improved statistical analysis, reconstruction algorithms, and quantitative metrics to determine resolution and self-consistency.
The development of ultrashort X-ray pulse sources requires optics that keep the pulse length as short as possible. One source of pulse stretching is the penetration of the pulse into a crystal during diffraction. Another source is the inclination of the intensity front when the diffraction is asymmetric. The theory of short X-ray pulse diffraction has been well developed by many authors. As it is rather complicated, it is sometimes difficult to foresee the pulse behavior (mainly stretching) during diffraction in various crystal arrangements. In this article, a simple model is suggested that gives a qualitatively similar shape to the diffracted pulse which follows from exact theory. It allows proposal of what experimental arrangement is optimal to minimize the pulse stretching during diffraction. First, the effect of pulse stretching due to penetration into a crystal surface is studied. On the basis of this, the pulse profile change during diffraction by two crystals, either symmetric or asymmetric, is predicted.
- Klíčová slova
- X-ray pulse diffraction, X-ray pulse stretching, short X-ray pulses,
- Publikační typ
- časopisecké články MeSH
Single Particle Imaging (SPI) with intense coherent X-ray pulses from X-ray free-electron lasers (XFELs) has the potential to produce molecular structures without the need for crystallization or freezing. Here we present a dataset of 285,944 diffraction patterns from aerosolized Coliphage PR772 virus particles injected into the femtosecond X-ray pulses of the Linac Coherent Light Source (LCLS). Additional exposures with background information are also deposited. The diffraction data were collected at the Atomic, Molecular and Optical Science Instrument (AMO) of the LCLS in 4 experimental beam times during a period of four years. The photon energy was either 1.2 or 1.7 keV and the pulse energy was between 2 and 4 mJ in a focal spot of about 1.3 μm x 1.7 μm full width at half maximum (FWHM). The X-ray laser pulses captured the particles in random orientations. The data offer insight into aerosolised virus particles in the gas phase, contain information relevant to improving experimental parameters, and provide a basis for developing algorithms for image analysis and reconstruction.
Crystalline order of molded and then bi-axially stretched foils prepared from atactic PVC resin is investigated by means of wide-angle neutron diffraction (WAND). The observed high-resolution WAND patterns of all samples are dominated by a sharp maximum corresponding to the inter-planar distance 0.52 nm. Two weaker maxima are also resolved at 0.62 and 0.78 nm. Intensities of the peaks vary with deformation ratios of the samples and their diffraction position. Average size of the coherently scattering domains is estimated as approximately 4-8 nm. Based on the experimental data, a novel model of crystalline order of atactic PVC is proposed.
- MeSH
- krystalografie metody MeSH
- membrány umělé * MeSH
- neutronová difrakce metody MeSH
- polyvinylchlorid chemie MeSH
- Publikační typ
- časopisecké články MeSH
- práce podpořená grantem MeSH
- Názvy látek
- membrány umělé * MeSH
- polyvinylchlorid MeSH
The digital large-angle convergent-beam electron diffraction (D-LACBED) technique is applied to Ca3Mn2O7 for a range of temperatures. Bloch-wave simulations are used to examine the effects that changes in different parameters have on the intensity in D-LACBED patterns, and atomic coordinates, thermal atomic displacement parameters and apparent occupancy are refined to achieve a good fit between simulation and experiment. The sensitivity of the technique to subtle changes in structure is demonstrated. Refined structures are in good agreement with previous determinations of Ca3Mn2O7 and show the decay of anti-phase oxygen octahedral tilts perpendicular to the c axis of the A21am unit cell with increasing temperature, as well as the robustness of oxygen octahedral tilts about the c axis up to ∼400°C. The technique samples only the zero-order Laue zone and is therefore insensitive to atom displacements along the electron-beam direction. For this reason it is not possible to distinguish between in-phase and anti-phase oxygen octahedral tilting about the c axis using the [110] data collected in this study.
- Klíčová slova
- CBED, Ca3Mn2O7, LACBED, digital diffraction, electron diffraction,
- Publikační typ
- časopisecké články MeSH
