The complex index of refraction in the spectral range of 0.74 to 4.5 eV is studied by variable-angle spectroscopic ellipsometry in ferroelectric K0.5Na0.5NbO3 films. The 20-nm-thick cube-on-cube-type epitaxial films are grown on SrTiO3(001) and DyScO3(011) single-crystal substrates. The films are transparent and exhibit a significant difference between refractive indices Δn = 0.5 at photon energies below 3 eV. The energies of optical transitions are in the range of 3.15-4.30 eV and differ by 0.2-0.3 eV in these films. The observed behavior is discussed in terms of lattice strain and strain-induced ferroelectric polarization in epitaxial perovskite oxide films.

Czech Technical University Technicka 2 Prague 6 Czech Republic 166

Institute of Physics of the Czech Academy of Sciences Na Slovance 2 Prague 8 Czech Republic 18221

Microelectronics and Materials Physics Laboratories University of Oulu P O Box 4500 FI 90014 Oulun yliopisto Finland

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