The interest in understanding scaling limits of magnetic textures such as domain walls spans the entire field of magnetism from its physical fundamentals to applications in information technologies. Here, we explore antiferromagnetic CuMnAs in which imaging by x-ray photoemission reveals the presence of magnetic textures down to nanoscale, reaching the detection limit of this established microscopy in antiferromagnets. We achieve atomic resolution by using differential phase-contrast imaging within aberration-corrected scanning transmission electron microscopy. We identify abrupt domain walls in the antiferromagnetic film corresponding to the Néel order reversal between two neighboring atomic planes. Our work stimulates research of magnetic textures at the ultimate atomic scale and sheds light on electrical and ultrafast optical antiferromagnetic devices with magnetic field-insensitive neuromorphic functionalities.

Center for Nanophase Materials Sciences Oak Ridge National Laboratory Oak Ridge TN 37831 USA

Central European Institute of Technology Brno University of Technology Purkyňova 123 612 00 Brno Czech Republic

Department of Physics and Astronomy Uppsala University Box 516 75120 Uppsala Sweden

Diamond Light Source Harwell Science and Innovation Campus Didcot Oxfordshire OX11 ODE UK

Faculty of Mathematics and Physics Charles University Ke Karlovu 3 121 16 Prague 2 Czech Republic

Institut de Ciencia de Materials de Barcelona Campus UAB 08193 Bellaterra Spain

Institut für Festkörper und Materialphysik Technische Universität Dresden 01062 Dresden Germany

Institute of Physics Academy of Sciences of the Czech Republic Cukrovarnická 10 162 00 Praha 6 Czech Republic

MAX 4 Laboratory Lund University 22100 Lund Sweden

School of Physics and Astronomy University of Nottingham Nottingham NG7 2RD UK

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