Specifics of the data processing of precession electron diffraction tomography data and their implementation in the program PETS2.0
Status PubMed-not-MEDLINE Jazyk angličtina Země Anglie, Velká Británie Médium print-electronic
Typ dokumentu časopisecké články
Grantová podpora
16-10035S
Grantová Agentura České Republiky
TG02010056
Technologická Agentura České Republiky
TG02010056
Czech Technological Agency
SOLID21 CZ.02.1.010.00.016_0190000760
European Structural and Investment Funds and the Czech Ministry of Education, Youth and Sports
CZ.2.163.1.0024510
Operation program Prague Competitiveness
PubMed
32830709
DOI
10.1107/s2052520619007534
PII: S2052520619007534
Knihovny.cz E-zdroje
- Klíčová slova
- crystal orientation, electron diffraction tomography, precession electron diffraction, profile fitting, serial electron crystallography,
- Publikační typ
- časopisecké články MeSH
Electron diffraction tomography (EDT) data are in many ways similar to X-ray diffraction data. However, they also present certain specifics. One of the most noteworthy is the specific rocking curve observed for EDT data collected using the precession electron diffraction method. This double-peaked curve (dubbed `the camel') may be described with an approximation based on a circular integral of a pseudo-Voigt function and used for intensity extraction by profile fitting. Another specific aspect of electron diffraction data is the high likelihood of errors in the estimation of the crystal orientation, which may arise from the inaccuracies of the goniometer reading, crystal deformations or crystal movement during the data collection. A method for the refinement of crystal orientation for each frame individually is proposed based on the least-squares optimization of simulated diffraction patterns. This method provides typical angular accuracy of the frame orientations of less than 0.05°. These features were implemented in the computer program PETS 2.0. The implementation of the complete data processing workflow in the program PETS and the incorporation of the features specific for electron diffraction data is also described.
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